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1

Precipitation, aggregation, and diffusion in heavily arsenic-doped silicon

Nobili, D., Solmi, S., Parisini, A., Derdour, M., Armigliato, A., Moro, L.

Journal:

Physical Review B

Year:

1994

Language:

english

File:

PDF, 1.01 MB

english, 1994

2

Effect of nitrogen implantation at the SiO[sub 2]/SiC interface on the electron mobility and free carrier density in 4H-SiC metal oxide semiconductor field effect transistor channel

Poggi, A., Moscatelli, F., Solmi, S., Armigliato, A., Belsito, L., Nipoti, R.

Journal:

Journal of Applied Physics

Year:

2010

Language:

english

File:

PDF, 645 KB

english, 2010

3

Preparation and characterization of Au-SiO2 radio frequency co-sputtered thin films

A. Armigliato, G.G. Bentini, S. Guerri, P. Ostoja, L. Morettini

Journal:

Thin Solid Films

Year:

1976

Language:

english

File:

PDF, 2.64 MB

english, 1976

4

Characterization of titanium nitride films deposited onto silicon

A. Armigliato, G. Celotti, A. Garulli, S. Guerri, P. Ostoja, R. Rosa, G. Martinelli

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 1.49 MB

english, 1982

5

Ion-implanted TiN films as diffusion barriers in silicon device technology

A. Armigliato, M. Finetti, A. Garulli, S. Guerri, R. Lotti, P. Ostoja

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 599 KB

english, 1985

6

Electron microscopy observations of N2+ -implanted TiN films as diffusion barriers for very-large-scale integration applications

A. Armigliato, M. Finetti, S. Guerri, P. Ostoja, A. Scorzoni, J. Garrido

Journal:

Thin Solid Films

Year:

1986

Language:

english

File:

PDF, 397 KB

english, 1986

7

On the assessment of local stress distributions in integrated circuits

J. Vanhellemont, I. De Wolf, K.G.F. Janssens, S. Frabboni, R. Balboni, A. Armigliato

Journal:

Applied Surface Science

Year:

1993

Language:

english

File:

PDF, 573 KB

english, 1993

8

Synthesis of MMoO4/SiO2 catalysts (M=Ni or Co) by a sol–gel route via silicon alkoxides: Stabilization of β-NiMoO4 at room temperature

D Cauzzi, M Deltratti, G Predieri, A Tiripicchio, A Kaddouri, C Mazzocchia, E Tempesti, A Armigliato, C Vignali

Journal:

Applied Catalysis A: General

Year:

1999

Language:

english

File:

PDF, 471 KB

english, 1999

9

Low temperature dopant activation of BF2implanted silicon

G. Queirolo, C. Bresolin, D. Robba, M. Anderle, R. Canteri, A. Armigliato, G. Ottaviani, S. Frabboni

Journal:

Journal of Electronic Materials

Year:

1991

Language:

english

File:

PDF, 1.12 MB

english, 1991

10

Identification of the source fault of the 1908 Messina earthquake through tsunami modelling. Is it a possible task?

S. Tinti, A. Armigliato, E. Bortolucci, A. Piatanesi

Journal:

Physics and Chemistry of the Earth, Part B: Hydrology, Oceans and Atmosphere

Year:

1999

Language:

english

File:

PDF, 573 KB

english, 1999

11

Dopant and carrier concentration in Si in equilibrium with monoclinic SiP precipitates

Solmi, S., Parisini, A., Angelucci, R., Armigliato, A., Nobili, D., Moro, L.

Journal:

Physical Review B

Year:

1996

Language:

english

File:

PDF, 674 KB

english, 1996

12

heavily implanted silicon

Allain, J. L., Regnard, J. R., Bourret, A., Parisini, A., Armigliato, A., Tourillon, G., Pizzini, S.

Journal:

Physical Review B

Year:

1992

Language:

english

File:

PDF, 527 KB

english, 1992

13

Anomalous low-temperature dopant diffusivity and defect structure in Sb- and Sb/B-implanted annealed silicon samples

Armigliato, A., Romanato, F., Drigo, A., Carnera, A., Brizard, C., Regnard, J. R., Allain, J. L.

Journal:

Physical Review B

Year:

1995

Language:

english

File:

PDF, 1.58 MB

english, 1995

14

ECS Transactions [ECS 26th Symposium on Microelectronics Technology and Devices (SBMicro 2011) - Joao Pessoa, Brazil (August 30 - September 2, 2011)] - Evaluation of Low Cost Metallization Process for Power Electronic Modules by Wire Wedge Bond Process on Nickel/Copper and Nickel/Copper/Silver Pads

Biasotto, C., Isoda, Luiz B., Franco, Cibele S., Armigliato, Nelson

Year:

2011

Language:

english

File:

PDF, 346 KB

english, 2011

15

Transmission Electron Diffraction Techniques for NM Scale Strain Measurement in Semiconductors

Vanhellemont, J., Janssens, K. G. F., Frabboni, S., Smeys, P., Balboni, R., Armigliato, A.

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 3.21 MB

english, 1995

16

Transmission Electron Diffraction Techniques for Nm Scale Strain Measurement in Semiconductors

Vanhellemont, J., Janssens, K. G. F., Frabboni, S., Smeys, P., Balboni, R., Armigliato, A.

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 3.32 MB

english, 1995

17

A numerical investigation of the 1783 landslide-induced catastrophic tsunami in Scilla, Italy

Filippo, Zaniboni, Alberto, Armigliato, Stefano, Tinti

Journal:

Natural Hazards

Year:

2016

Language:

english

File:

PDF, 6.71 MB

english, 2016

18

Assessment of the 1783 Scilla landslide–tsunami's effects on the Calabrian and Sicilian coasts through numerical modeling

Zaniboni, Filippo, Pagnoni, Gianluca, Gallotti, Glauco, Paparo, Maria Ausilia, Armigliato, Alberto, Tinti, Stefano

Journal:

Natural Hazards and Earth System Science

Year:

2019

Language:

english

File:

PDF, 19.16 MB

english, 2019

19

The Large Earthquake (~ M7) and Its Associated Tsunami of 8 November 1905 in Mt. Athos, Northern Greece

Triantafyllou, Ι., Zaniboni, F., Armigliato, A., Tinti, S., Papadopoulos, G. A.

Journal:

Pure and Applied Geophysics

Year:

2019

Language:

english

File:

PDF, 5.25 MB

english, 2019

20

Relationships between radial atomic distribution curves and the mechanism for the paracrystal-crystal transition of isotactic polypropylene

R. Zannetti, G. Celotti, A. Armigliato

Journal:

European Polymer Journal

Year:

1970

Language:

english

File:

PDF, 526 KB

english, 1970

21

Analysis of boron predeposited silicon wafers by combined ion beam techniques and X-ray microanalysis

A. Armigliato, G.G. Bentini, G. Ruffini, G. Battaglin, G. Della Mea, A.V. Drigo

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 494 KB

english, 1978

22

Oxygen and implanted ion profiles in oxidized zirconium

M. Berti, A. Carnera, A.V. Drigo, A. Armigliato, A. Desalvo, R. Rosa

Journal:

Nuclear Instruments and Methods

Year:

1981

Language:

english

File:

PDF, 555 KB

english, 1981

23

Arsenic ion implantation through Mo and Mo silicide layers for shallow junction formation

R. Angelucci, S. Solmi, A. Armigliato, E. Gabilli, D. Govoni, M. Merli, A. Poggi

Journal:

Solid-State Electronics

Year:

1992

Language:

english

File:

PDF, 1.38 MB

english, 1992

24

Round robin investigation of silicon oxide on silicon reference materials for ellipsometry

J. Vanhellemont, H.E. Maes, M. Schaekers, A. Armigliato, H. Cerva, A. Cullis, J. de Sande, H. Dinges, J. Hallais, V. Nayar, C. Pickering, J.-L. Stehlé, J. Van Landuyt, C. Walker, H. Werner, P. Salieri

Journal:

Applied Surface Science

Year:

1993

Language:

english

File:

PDF, 591 KB

english, 1993

25

A color video presentation of simulated high resolution lattice images

P. Venturi, A. Armigliato, A.M. Mazzone, D. Govoni

Journal:

Ultramicroscopy

Year:

1984

Language:

english

File:

PDF, 170 KB

english, 1984

26

Preparation of silicon cross-sectional specimens for TEM observation

A. Garulli, M. Vanzi, M. Giannini, A. Armigliato

Journal:

Ultramicroscopy

Year:

1984

Language:

english

File:

PDF, 95 KB

english, 1984

27

A computer programme for an automated electron microprobe to solve X-ray interferences

A. Armigliato, A. Garulli, D. Gavoni, P. Venturi

Journal:

Ultramicroscopy

Year:

1984

Language:

english

File:

PDF, 87 KB

english, 1984

28

High resolution electron microscopy observations of precipitates in p-supersaturated silicon

A. Armigliato, P. Werner

Journal:

Ultramicroscopy

Year:

1984

Language:

english

File:

PDF, 1.76 MB

english, 1984

29

A preparation technique for TEM cross-sections of test structures with reduced feature size

A. Garulli, A. Armigliato, M. Finetti

Journal:

Ultramicroscopy

Year:

1988

Language:

english

File:

PDF, 1.10 MB

english, 1988

30

Simultaneous determination of composition and thickness of thin films by x-ray microanalysis at 300 kV and Monte Carlo simulation

A. Armigliato, R. Rosa

Journal:

Ultramicroscopy

Year:

1990

Language:

english

File:

PDF, 764 KB

english, 1990

31

Characterization of TiOx films and their application as antireflection coatings for silicon solar cells

A. Armigliato, G. Celotti, S. Guerri, P. Ostoja, R. Rosa, G. Martinelli

Journal:

Year:

1981

Language:

english

File:

PDF, 1004 KB

english, 1981

32

Analysis of crystal defects by transmission electron microscopy

Journal:

Materials Chemistry

Year:

1979

Language:

english

File:

PDF, 1.34 MB

english, 1979

33

Investigation of amorphous a-Si:H/a-Si1−xCx:H multi-quantum-well structures

M. De Seta, P. Fiorini, F. Evangelisti, A. Armigliato

Journal:

Superlattices and Microstructures

Year:

1989

Language:

english

File:

PDF, 354 KB

english, 1989

34

Depth profiles and damage annealing of 1.06 MeV As2+ Implanted in silicon

A. Armigliato, R. Nipoti, G.G. Bentini, A.M. Mazzone, M. Bianconi, A. Nylandsted Larsen, A. Gasparotto

Journal:

Materials Science and Engineering: B

Year:

1989

Language:

english

File:

PDF, 379 KB

english, 1989

35

Recent findings in silicon doping with phosphorous

D. Nobili, S. Solmi, A. Parisini, A. Armigliato, L. Moro

Journal:

Renewable Energy

Year:

1994

Language:

english

File:

PDF, 82 KB

english, 1994

36

The generating mechanisms of the August 17, 1999 İzmit bay (Turkey) tsunami: Regional (tectonic) and local (mass instabilities) causes

Stefano Tinti, Alberto Armigliato, Anna Manucci, Gianluca Pagnoni, Filippo Zaniboni, Ahmet Cevdet Yalçiner, Yildiz Altinok

Journal:

Year:

2006

Language:

english

File:

PDF, 1.28 MB

english, 2006

37

Damage and recovery in doped SOI layers after high energy implantation

M. Ferri, S. Solmi, A. Armigliato, M. Bianconi, G. Lulli, D. Nobili

Journal:

Materials Science and Engineering: B

Year:

2004

Language:

english

File:

PDF, 256 KB

english, 2004

38

Strain field reconstruction in shallow trench isolation structures by CBED and LACBED

A. Spessot, S. Frabboni, R. Balboni, A. Armigliato

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2006

Language:

english

File:

PDF, 745 KB

english, 2006

39

Boron nitride thin films deposited by RF plasma reactive pulsed laser ablation as interlayer between WC–Co hard metals and CVD diamond films

E Cappelli, S Orlando, G Mattei, A Armigliato

Journal:

Surface and Coatings Technology

Year:

2004

Language:

english

File:

PDF, 990 KB

english, 2004

40

The use of scenarios to evaluate the tsunami impact in southern Italy

Stefano Tinti, Alberto Armigliato

Journal:

Year:

2003

Language:

english

File:

PDF, 1.31 MB

english, 2003

41

Techniques for mechanical strain analysis in sub-micrometer structures: TEM/CBED, micro-Raman spectroscopy, X-ray micro-diffraction and modeling

I De Wolf, V Senez, R Balboni, A Armigliato, S Frabboni, A Cedola, S Lagomarsino

Journal:

Microelectronic Engineering

Year:

2003

Language:

english

File:

PDF, 782 KB

english, 2003

42

Strain induced by Ti salicidation in sub-quarter-micron CMOS devices, as measured by TEM/CBED

A. Benedetti, A.G. Cullis, A. Armigliato, R. Balboni, S. Frabboni, G.F. Mastracchio, G. Pavia

Journal:

Applied Surface Science

Year:

2002

Language:

english

File:

PDF, 173 KB

english, 2002

43

Investigation of strain distribution in LOCOS structures by dynamical simulation of LACBED patterns

Feng Wu, Aldo Armigliato, Roberto Balboni, Stefano Frabboni

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 777 KB

english, 1999

44

Editorial

A. Armigliato, A. Bellosi

Journal:

Journal of the European Ceramic Society

Year:

1996

Language:

english

File:

PDF, 58 KB

english, 1996

45

TEM/CBED determination of strain in silicon-based submicrometric electronic devices

A Armigliato, R Balboni, S Balboni, S Frabboni, A Tixier, G.P Carnevale, P Colpani, G Pavia, A Marmiroli

Journal:

Year:

2000

Language:

english

File:

PDF, 2.42 MB

english, 2000

46

Preface

A Armigliato, E Carlino, M Catalano

Journal:

Year:

2000

Language:

english

File:

PDF, 18 KB

english, 2000

47

Metastability of Si1−yCy epilayers under 2 MeV α-particle irradiation

M Berti, D De Salvador, A.V Drigo, M Petrovich, J Stangl, F Schäffler, S Zerlauth, G Bauer, A Armigliato

Journal:

Year:

2000

Language:

english

File:

PDF, 177 KB

english, 2000

48

Strain characterisation of shallow trench isolation structures on a nanometer scale by convergent beam electron diffraction

A. Armigliato, R. Balboni, S. Frabboni, A. Benedetti, A.G. Cullis, G.P. Carnevale, P. Colpani, G. Pavia

Journal:

Materials Science in Semiconductor Processing

Year:

2001

Language:

english

File:

PDF, 167 KB

english, 2001

49

Single-force point-source static fields: an exact solution for two elastic half-spaces

Stefano Tinti, Alberto Armigliato

Journal:

Geophysical Journal International

Year:

1998

Language:

english

File:

PDF, 1.45 MB

english, 1998

50

A 2-D hybrid technique to model the effect of topography on coseismic displacements. Application to the Umbria-Marche (central Italy) 1997 earthquake sequence

Stefano Tinti, Alberto Armigliato

Journal:

Geophysical Journal International

Year:

2002

Language:

english

File:

PDF, 1.04 MB

english, 2002

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